Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

Authors
Sushko, PV Foster, AS Kantorovich, LN Shluger, AL
Citation
Pv. Sushko et al., Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM), APPL SURF S, 145, 1999, pp. 608-612
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
145
Year of publication
1999
Pages
608 - 612
Database
ISI
SICI code
0169-4332(199904)145:<608:ITEOST>2.0.ZU;2-R
Abstract
We have studied the possible modifications to a noncontact scanning force m icroscopy (SFM) silicon tip due to adsorption of species from the gas phase and due to contact with a NaCl surface. A model of the tip was developed b ased on a 33 atom silicon cluster, and then the different adsorbates were a dded and changes to tip electrostatic properties investigated. The interact ion of a silicon tip with a NaCl surface was modelled quantum mechanically, allowing us to calculate the charge state of the adsorbed chlorine ion in the process of separation of the two surfaces. (C) 1999 Elsevier Science B. V. All rights reserved.