Citation
J. Fraxedas et al., Surface morphology of organic thin films, APPL SURF S, 145, 1999, pp. 623-626
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332
→ ACNP
Volume
145
Year of publication
1999
Pages
623 - 626
Database
ISI
SICI code
0169-4332(199904)145:<623:SMOOTF>2.0.ZU;2-V
Abstract
Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (
TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown
on alkali halide substrates by vapor deposition techniques. Their surfaces
reveal clearly differentiated morphologies, as measured with tapping mode a
tomic force microscopy (TMAFM), exhibiting different kinds of defects. Howe
ver, the films order in similar layered molecular structures parallel to th
e substrate plane. (C) 1999 Elsevier Science B.V. All rights reserved.