Probing the organization of adsorbed protein layers: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Atomic force microscopy (AFM) has been used to investigate the organization of the collagen layer present on polymer substrata after adsorption and dr ying, while the adsorbed amount was monitored using X-ray photoelectron spe ctroscopy (XPS) and radiochemical measurements. Differences in the organiza tion of the adsorbed collagen layer (surface coverage, layer thickness) obs erved by AFM fitted well with those found by models obtained from XPS and r adiolabeling data. (C) 1999 Elsevier Science B.V. All rights reserved.