Thin sample in the XRF analysis. A new method of preparing microsamples ofmono- and polycrystals and of silicate rocks

The authors have described a new method of preparation of thin samples, whi ch consists in digesting of the material studied directly on the substrate. investigations were carried our in the sub- and microanalytical area with mono- and polycrystals of spinel structure (samples' mass from 0.1 to 1.2 m g), and in the semimicroanalytical area with silicate rocks (samples' mass from 5 to 50 mg). Relative thicknesses of samples as well as errors resulti ng from the lack of linear relationship between concentration and intensity of radiation have been determined using simple mathematical methods. A sim plified method of performing the calibration has been applied by using one standard of diversified masses. In the case of submicroanalysis of mono- an d polycrystals, a possibility of neglecting the interelement influences all owed for using a linear regression in the calibration. In the semimicroanal ytical area (rock analysis), the appropriate mathematical models have been used to improve the results.