Crystallization process of the low-temperature-deposited AlN buffer layer o
n sapphire, and atomic step motion of the crystallized AlN has been observe
d in situ by TEM. Insertion of the second low-temperature-deposited buffer
layer between high-temperature-grown GaN is found to reduce threading dislo
cations and to eradicate etch-pit formation. (C) 1999 Elsevier Science S.A.
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