Growth of GaN on highly mismatched substrate and its application to novel devices

Citation
H. Amano et al., Growth of GaN on highly mismatched substrate and its application to novel devices, DIAM RELAT, 8(2-5), 1999, pp. 302-304
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
8
Issue
2-5
Year of publication
1999
Pages
302 - 304
Database
ISI
SICI code
0925-9635(199903)8:2-5<302:GOGOHM>2.0.ZU;2-8
Abstract
Crystallization process of the low-temperature-deposited AlN buffer layer o n sapphire, and atomic step motion of the crystallized AlN has been observe d in situ by TEM. Insertion of the second low-temperature-deposited buffer layer between high-temperature-grown GaN is found to reduce threading dislo cations and to eradicate etch-pit formation. (C) 1999 Elsevier Science S.A. All rights reserved.