CNx film characterization by surface sensitive methods: XPS and XAES

Citation
Ap. Dementjev et al., CNx film characterization by surface sensitive methods: XPS and XAES, DIAM RELAT, 8(2-5), 1999, pp. 601-604
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
8
Issue
2-5
Year of publication
1999
Pages
601 - 604
Database
ISI
SICI code
0925-9635(199903)8:2-5<601:CFCBSS>2.0.ZU;2-E
Abstract
The C 1s and N 1s XPS spectra of samples prepared: in situ (nitrogen ion im plantation to graphite); ex situ films with several ratio of C/N and C/N/O and melomine (C3N6H6) have been studied. The C 1s spectra of the standard C 3N6H6 have splitting 3.3 eV that cannot be explain only by the chemical int eraction; besides, in that compound the atoms of carbon have only one chemi cal state. It is very problematic to identify the C 1s spectrum in terms on ly of chemical shifts, but probably it is stipulated by some unknown physic al properties of the CNx and CNxOy chemical compounds. The problems of the synthesis of C3N4 are the difficulties of the formation of stoichiometric compound and a monitoring of sp(3)-bonds of carbon atoms as well. The possibilities of the C KVV Auger identification of sp(2)-sp(3 )-bonds in CNx and CNxOy are shown. (C) 1999 Elsevier Science S.A. All righ ts reserved.