This contribution deals with the study and realization of optical planar wa
veguides on semiconductor (silicon) substrate by the method of plasma enhan
ced chemical vapor deposition (PECVD). Planar waveguides are created by a c
arbon layer deposited in the PECVD apparatus on a silicon oxide layer which
provides optical shielding of the substrate and is prepared by oxidation o
f a silicon wafer. Optical properties of the waveguides were measured by st
andard prism spectroscopy at wavelength 633 nm. The attenuation of the wave
guide at the best sample was 0.3 dB cm(-1). (C) 1999 Elsevier Science S.A.
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