High-resolution electron microscopy and electron spin resonance studies oncubic boron nitride crystals made by high-pressure/high-temperature synthesis
L. Nistor et al., High-resolution electron microscopy and electron spin resonance studies oncubic boron nitride crystals made by high-pressure/high-temperature synthesis, DIAM RELAT, 8(2-5), 1999, pp. 738-742
Cubic boron nitride (c-BN) crystals synthesised at high pressures and tempe
ratures are analysed by optical microscopy, transmission electron microscop
y, electron diffraction and electron spin resonance. For various growth con
ditions, the results of these studies indicate that the c-BN crystals conta
in defects and impurities. This is the first time that dislocation cores ha
ve been revealed in c-BN at the atomic level. Atomic resolution at extended
dislocations allows us to determine the stacking-fault energy in c-BN, yie
lding a mean value of 191+/-15 mJ m(-2). This value, which is reported for
the first time for c-BN, is of the same order of magnitude as in diamond. (
C) 1999 Elsevier Science S.A. All rights reserved.