High-resolution electron microscopy and electron spin resonance studies oncubic boron nitride crystals made by high-pressure/high-temperature synthesis

Citation
L. Nistor et al., High-resolution electron microscopy and electron spin resonance studies oncubic boron nitride crystals made by high-pressure/high-temperature synthesis, DIAM RELAT, 8(2-5), 1999, pp. 738-742
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
8
Issue
2-5
Year of publication
1999
Pages
738 - 742
Database
ISI
SICI code
0925-9635(199903)8:2-5<738:HEMAES>2.0.ZU;2-2
Abstract
Cubic boron nitride (c-BN) crystals synthesised at high pressures and tempe ratures are analysed by optical microscopy, transmission electron microscop y, electron diffraction and electron spin resonance. For various growth con ditions, the results of these studies indicate that the c-BN crystals conta in defects and impurities. This is the first time that dislocation cores ha ve been revealed in c-BN at the atomic level. Atomic resolution at extended dislocations allows us to determine the stacking-fault energy in c-BN, yie lding a mean value of 191+/-15 mJ m(-2). This value, which is reported for the first time for c-BN, is of the same order of magnitude as in diamond. ( C) 1999 Elsevier Science S.A. All rights reserved.