Chord bisection strategy for fast ellipse location

It is shown that a previously proposed rapid sampling technique can be exte nded using a strategy based on chord bisection. The strategy is characteris ed by very high speed of operation coupled with accurate location, and can be matched to the level of robustness required by the application. The new technique has been tested on images in which the ellipses are cereal grains with close to 2:1 aspect ratio, but it appears to be suitable for locating ellipses of any eccentricity with near ultimate speed of processing.