The fundamental 1/f noise and the hooge parameter in semiconductor quantumwires

Citation
A. Balandin et al., The fundamental 1/f noise and the hooge parameter in semiconductor quantumwires, IEEE DEVICE, 46(6), 1999, pp. 1240-1244
Citations number
24
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
46
Issue
6
Year of publication
1999
Pages
1240 - 1244
Database
ISI
SICI code
0018-9383(199906)46:6<1240:TF1NAT>2.0.ZU;2-Z
Abstract
We have calculated the Hooge parameter alpha(H) characterizing fundamental 1/f noise in a free-standing intrinsic silicon quantum wire using microscop ic noise theory. Our model takes into account quasi-one-dimensional confine ment of both phonons and electrons. We find that at low temperatures, alpha (H) can be reduced significantly by an external magnetic field which suppre sses large-angle electron scattering. This allows one to quench 1/f noise. Furthermore, a magnetic field provides a convenient tool to probe the sourc e of noise in quantum wires, and, to a certain degree, test the validity of the microscopic mobility-fluctuation quantum noise model itself.