Thin layers of tin monosulphide have been grown from equimolar solutions of
tin chloride and N,N-dimethyl thiourea on Coming 7059 glass substrates at
various temperatures in the range 100-450 degrees C using spray pyrolysis.
The structural properties have been determined by using x-ray diffraction a
nd scanning electron microscopy to evaluate the crystalline phases present
and the surface topography of the grown layers. The changes observed in the
structural phases with the growth temperature during the film formation ar
e reported and discussed.