Catastrophic transformation of electron stress and electron stiffness parameter on metal and semiconductor

Citation
S. Kotake et al., Catastrophic transformation of electron stress and electron stiffness parameter on metal and semiconductor, ADV MATERIA, 1998, pp. 195-209
Categorie Soggetti
Current Book Contents
ISSN journal
14351889
Year of publication
1998
Pages
195 - 209
Database
ISI
SICI code
1435-1889(1998):<195:CTOESA>2.0.ZU;2-E