Extended depth of field and aberration control for inexpensive digital microscope systems

We present a new application and current results for extending depth of fie ld using wave front coding. A cubic phase plate is used to code wave fronts in microscopy resulting in extended depths of field and inexpensive chroma tic aberration control. A review of the theory behind cubic phase plate ext ended depth of field systems is given along with the challenges that are fa ce when applying the theory to microscopy. Current results from the new ext ended depth of field microscope systems are shown (C) 1998 Optical Society of America.