STUDY OF PHOTOELECTRON EMISSION YIELD FROM LAYERED STRUCTURES IN PRESENCE OF RESONANCE-ENHANCED X-RAY PROPAGATION EFFECT

In this work we present the new experimental results of total photoele ctric yield as well as energy distribution of photoelectrons excited i n a thin carbon film deposited on Ni mirror in the presence of resonan ce-enhanced X-ray propagation effect. The measurements were performed using conventional X-ray tube as a radiation source for the energy Cu K-alpha (8047 keV). The spectra were recorded using a flow proportiona l electron counter with energy resolution of about 15%, and multichann el pulse height analyzer. A comparison with the reflectivity spectra r ecorded at the same time show an excellent correlation of both kinds o f spectra, consistently with the theoretical prediction. A map of elec tron energy distribution is reported. Although the applied electron co unter was of low energetic resolution the recorded spectra show charac teristic regularities and indicate that the photoelectron yield excite d in the presence of resonance-enhanced X-ray propagation effect can p rovide depth dependent information about impurity distribution and pro cesses in thin layers.