Thin films of TiO2-SnO2 and SrTiO3-BaTiO3 are deposited by rf sputteri
ng. The crystallographic and optical properties near the band gap abso
rption are investigated as a function of film composition. Systematic
displacement of the fundamental absorption edge shows different behavi
our for amorphous and polycrystalline samples. Results are discussed i
n terms of the influence of the substitution on the local environment
of Ti ion and Me-O distances. Application of XANES and EXAFS is propos
ed for the studies of solid-state solutions.