X-RAY STRUCTURE PERFECTION DIAGNOSTICS OF SLIGHTLY DISTORTED SILICON-CRYSTALS IN THE BRAGG-CASE OF DIFFRACTION

Authors
KHRUPA V KRASULYA S MACHULIN V DATSENKO L AULEYTNER J
Citation
V. Khrupa et al., X-RAY STRUCTURE PERFECTION DIAGNOSTICS OF SLIGHTLY DISTORTED SILICON-CRYSTALS IN THE BRAGG-CASE OF DIFFRACTION, Acta Physica Polonica. A, 91(5), 1997, pp. 981-985
Citations number
10
Categorie Soggetti
Physics
Journal title
Acta Physica Polonica. A → ACNP
ISSN journal
05874246
Volume
91
Issue
5
Year of publication
1997
Pages
981 - 985
Database
ISI
SICI code
0587-4246(1997)91:5<981:XSPDOS>2.0.ZU;2-J
Abstract
A new approach to structure perfection diagnostics of dislocation-free silicon crystals has been developed using the Bragg case of diffracti on. The approach is being based on successive measurements of integral reflectivity and the spatial intensity distribution of reflected beam on the same diffraction planes of a real crystal by means of a single crystal diffractometer.