X-ray diffraction study of chalcopyrite ordering in epitaxial ZnSnP2 grownon GaAs

We report on the structural characterization of epitaxial ZnSnP2 grown on G aAs (001). Ordering of Zn and Sn atoms in the cation sublattice is observed by high-resolution x-ray diffraction. By varying the growth conditions, sa mples with two distinct structures were obtained: one showing chalcopyrite ordering with the tetragonal axis oriented along the growth direction and t he other showing no evidence of ordering. Chalcopyrite ordering was determi ned unambiguously by observing several characteristic reflections uniquely identifying this structure. (c) 1999 American Institute of Physics. [S0003- 6951(99)02924-1].