Hb. Wang et al., Microwave-induced current steps in intrinsic Josephson junctions patternedon Bi2Sr2CaCu2O8 single crystal, APPL PHYS L, 74(24), 1999, pp. 3693-3695
With a 10 mu mx10 mu m mesa patterned on Bi2Sr2CaCu2O8 single crystals, we
measure the current-voltage (I-V) curves of a stack of intrinsic Josephson
junctions. Current steps are observed at an equal voltage spacing of 4 mV w
hen the sample is subjected to microwave radiation at around 7 GHz. With in
crease of the microwave power, more steps occur while the spacing between n
eighboring steps does not seem to change. The magnitude of each step depend
s on the microwave power in an oscillating way. Tuning the microwave freque
ncy causes such steps to occur over separate frequency ranges, and each ran
ge is quite narrow. A temperature rise from 4.2 to 14.3 K completely quench
es the step structures. Possible explanations for the step structures, base
d on resonances excited by microwave or geometric resonances in the junctio
n cavity, are discussed. (c) 1999 American Institute of Physics. [S0003-695
1(99)04024-3].