Electron emission microscope for use in electron emission sites observations

Citation
S. Kobayashi et al., Electron emission microscope for use in electron emission sites observations, APPL SURF S, 146(1-4), 1999, pp. 148-151
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
146
Issue
1-4
Year of publication
1999
Pages
148 - 151
Database
ISI
SICI code
0169-4332(199905)146:1-4<148:EEMFUI>2.0.ZU;2-B
Abstract
An electron emission microscope (EEM) constructed for electron emission sit es observations is presented, This EEM consists of three unipotential lense s, a microchannel plate, and a phosphor screen, and has the advantage that it enables the observation of electron emission sites of not only a sharp p oint cathode, such as a field emitter, but also a broad area cathode surfac e. Experimental results obtained are as follows: i. the operation of this E EM was confirmed by observing photoelectron emission sites irradiated with ultraviolet light, and 2. field emission sites in broad area Al and Cu coul d be observed. (C) 1999 Published by Elsevier Science B.V. All rights reser ved.