Microscopical analysis of structure and work function of Ba-covered Si(111)-(7 x 7) surface

Citation
M. Komai et al., Microscopical analysis of structure and work function of Ba-covered Si(111)-(7 x 7) surface, APPL SURF S, 146(1-4), 1999, pp. 158-161
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
146
Issue
1-4
Year of publication
1999
Pages
158 - 161
Database
ISI
SICI code
0169-4332(199905)146:1-4<158:MAOSAW>2.0.ZU;2-N
Abstract
Microscopic 'work function' is evaluated by local tunneling barrier height (LBH) measurements of clean and Ba-deposited Si(lll) surfaces in order to c larify the mechanism of work function reduction by Ba deposition. Atomicall y resolved LBH images are obtained corresponding to scanning tunneling micr oscopy (STM) images. The difference in the LBH measurement for clean Si(111 )-(7 X 7) and Ba deposited Si(111)-(3 X 1) surfaces agrees with macroscopic work function reduction due to Ba adsorbate. The result suggests that the work function is strongly related to the atomic arrangement of the Si(lll) surface induced by Ba deposition. (C) 1999 Elsevier Science B.V. All rights reserved.