A TANGENT FORMULA DERIVED FROM PATTERSON-FUNCTION ARGUMENTS .3. STRUCTURE DETERMINATION OF ZEOLITIC AND LAYERED MATERIALS FROM LOW-RESOLUTION POWDER DIFFRACTION DATA
J. Rius et al., A TANGENT FORMULA DERIVED FROM PATTERSON-FUNCTION ARGUMENTS .3. STRUCTURE DETERMINATION OF ZEOLITIC AND LAYERED MATERIALS FROM LOW-RESOLUTION POWDER DIFFRACTION DATA, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 840-845
The viability of solving the structure type of zeolitic and layered ma
terials applying multisolution direct methods to low-resolution (simil
ar to 2.2 Angstrom) powder diffraction data is shown. The phases are r
efined with the tangent formula derived from Patterson-function argume
nts [Rius (1993). Acta Cryst. A49, 406-409] and the correct phase sets
are discriminated with the conventional figures of merit. The two tes
t examples presented are (a) the already known tetragonal zeolite ZSM-
11 (space group <I(4)over bar m2>) at 2.3 Angstrom resolution and (b)
the hitherto unknown layer silicate RUB-15 (Ibam) at 2.2 Angstrom reso
lution. In both cases, the tetrahedral Si units appear as resolved pea
ks in the Fourier maps computed with the phases of the highest ranked
direct-methods solutions.