Experimental evidence for Coulomb charging effects in submicron Bi-2212 stacks (vol 69, pg 84, 1999)

Authors
Latyshev, YI Kim, SJ Yamashita, T
Citation
Yi. Latyshev et al., Experimental evidence for Coulomb charging effects in submicron Bi-2212 stacks (vol 69, pg 84, 1999), JETP LETTER, 69(8), 1999, pp. 640-643
Citations number
1
Categorie Soggetti
Physics
Journal title
JETP LETTERS
ISSN journal
00213640 → ACNP
Volume
69
Issue
8
Year of publication
1999
Pages
640 - 643
Database
ISI
SICI code
0021-3640(19990425)69:8<640:EEFCCE>2.0.ZU;2-M