High resolution K capture X-ray fluorescence spectroscopy: A new tool for chemical characterization

Authors
Bergmann, U Glatzel, P deGroot, F Cramer, SP
Citation
U. Bergmann et al., High resolution K capture X-ray fluorescence spectroscopy: A new tool for chemical characterization, J AM CHEM S, 121(20), 1999, pp. 4926-4927
Citations number
21
Categorie Soggetti
Chemistry & Analysis",Chemistry
Journal title
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
ISSN journal
00027863 → ACNP
Volume
121
Issue
20
Year of publication
1999
Pages
4926 - 4927
Database
ISI
SICI code
0002-7863(19990526)121:20<4926:HRKCXF>2.0.ZU;2-A