The luminescent properties of GaN thin films grown by pulsed laser depositi
on have been studied to understand the nature of the luminescent centres an
d the recombination dynamics. The films were grown on heated sapphire subst
rates using KrF excimer laser ablation of GaN in a reactive atmosphere of n
itrogen. At low temperature the continuous wave (CW) blue luminescence of t
he samples grown shows two sharp lines attributed to excitonic recombinatio
n localized at extended defects. An analysis of the temperature dependence
of photoluminescence (PL) lifetimes assesses the relative contributions of
radiative and non-radiative recombination in the centres responsible for th
ese emissions. The measurement of room temperature nanosecond radiative lif
etimes for these lines supports the excitonic attribution of the luminescen
ce. (C) 1999 Elsevier Science S.A. All rights reserved.