Electro-optical characterization of h-BN thin film waveguides by prism coupling technique

Authors
Boudiombo, J Loulergue, JC Bath, A Thevenin, P
Citation
J. Boudiombo et al., Electro-optical characterization of h-BN thin film waveguides by prism coupling technique, MAT SCI E B, 59(1-3), 1999, pp. 244-247
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
59
Issue
1-3
Year of publication
1999
Pages
244 - 247
Database
ISI
SICI code
0921-5107(19990506)59:1-3<244:ECOHTF>2.0.ZU;2-4
Abstract
Waveguides were fabricated by deposition of boron nitride thin films onto g lass substrates by a microwave plasma enhanced chemical vapor deposition (P ECVD) process. We have characterized the optical linear properties of the a s-deposited layers by m-lines spectroscopy. We have used a simple method ba sed on the shift of the synchronous angles of the guided modes to investiga te the electro-optic tensor r(ij) using co-planar electrodes. With TM polar ized light the value of r(eff) computed is of the order of 5 pm V-1. (C) 19 99 Elsevier Science S.A. All rights reserved.