We have etched n-GaN grown both by plasma assisted MBE and MOCVD in 0.5 M K
OH under HeCd-laser illumination (110 mW cm(-2)) and controlled the photocu
rrent by an external voltage source. The reproducible etch depths were line
ar with respect to the charge. The examination of the dissolution potential
revealed strong dependence on illumination and current. Thereby, regimes t
o obtain smoothly etched surfaces were found at low dissolution potentials.
Demonstration of the possibilities in photoelectrochemical (PEC) etching a
re given. (C) 1999 Elsevier Science S.A. All rights reserved.