Formation of intense focused ion and atomic beams

Authors
Citation
Vi. Davydenko, Formation of intense focused ion and atomic beams, NUCL INST A, 427(1-2), 1999, pp. 230-234
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
427
Issue
1-2
Year of publication
1999
Pages
230 - 234
Database
ISI
SICI code
0168-9002(19990511)427:1-2<230:FOIFIA>2.0.ZU;2-1
Abstract
Series of injectors of focused neutralized ion and atomic beams with beam e nergy ranging from 5 to 40 keV, equivalent beam current of 1-20 A, angular divergence of beam similar to 10(-2) rad? equivalent current density in foc us of beam more than 1 A/cm(2), pulse duration of 0.1-100 ms is developed i n Budker Institute of Nuclear Physics. A specific approach to the formation of high brightness ion beams is used in these injectors. The low transvers e ion temperature of the plasma emitter is achieved by the use of plasma em itter formed by the collisionlessly expanding plasma jet. Ton beams are ext racted from the plasma emitter by precise multi-aperture four-electrode ion optics systems. Two methods of beam focusing have been tested and successf ully applied. In the first one the formed ion beam is focused by a magnetic lens and charge-exchanged into atoms in a pulse gas target. The second met hod is based on geometrical focusing of the beam by spherically bent electr odes of an ion optics system. To profit better use of the nonuniform plasma jet, the developed ion optics systems with geometrical beam focusing have gaps extending with radius which provides optimal beam formation from the e nlarged surface. (C) 1999 Elsevier Science B.V. All rights reserved.