Structure of (ZrO2)(x)(SiO2)(1-x) xerogels (x=0.1, 0.2, 0.3 and 0.4) from FTIR, Si-29 and O-17 MAS NMR and EXAFS

Citation
Dm. Pickup et al., Structure of (ZrO2)(x)(SiO2)(1-x) xerogels (x=0.1, 0.2, 0.3 and 0.4) from FTIR, Si-29 and O-17 MAS NMR and EXAFS, PCCP PHYS C, 1(10), 1999, pp. 2527-2533
Citations number
28
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
PCCP PHYSICAL CHEMISTRY CHEMICAL PHYSICS
ISSN journal
14639076 → ACNP
Volume
1
Issue
10
Year of publication
1999
Pages
2527 - 2533
Database
ISI
SICI code
1463-9076(19990515)1:10<2527:SO(X(0>2.0.ZU;2-F
Abstract
A combination of Si-29 and O-17 MAS NMR, EXAFS and FTIR spectroscopy has be en used to study the atomic structure of(ZrO2)(x)(SiO2)(1-x) (x = 0.1, 0.2, 0.3 and 0.4) xerogels prepared by reacting partially hydrolysed tetraethyl orthosilicate with zirconium(rv) propoxide. Results from (ZrO2)(0.1)(SiO2) (0.9) samples reveal the oxides to be atomically mixed with no evidence of phase separation. In these samples, the nearest neighbour environment of zi rconium is similar to that found in cubic zirconia. In the (ZrO2)(0.4)(SiO2 )(0.6) samples, phase separation occurs with a significant proportion of th e zirconium present as amorphous ZrO2 with a local structure similar to tha t of monoclinic zirconia. O-17 MAS NMR and EXAFS have proven valuable techn iques for gauging the level of atomic mixing in these materials.