Applications of x-ray photoelectron spectroscopy and secondary ion mass spectrometry in characterization of polymer blends

Authors
Chan, CM Wu, JS Mai, YW
Citation
Cm. Chan et al., Applications of x-ray photoelectron spectroscopy and secondary ion mass spectrometry in characterization of polymer blends, PLAST ENGN, 52, 1999, pp. 415-449
Categorie Soggetti
Current Book Contents","Current Book Contents
Journal title
POLYMER BLENDS AND ALLOYS → ACNP
Volume
52
Year of publication
1999
Pages
415 - 449
Database
ISI
SICI code