A low-temperature dynamic mode scanning force microscope operating in highmagnetic fields

Authors
Rychen, J Ihn, T Studerus, P Herrmann, A Ensslin, K
Citation
J. Rychen et al., A low-temperature dynamic mode scanning force microscope operating in highmagnetic fields, REV SCI INS, 70(6), 1999, pp. 2765-2768
Citations number
15
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
6
Year of publication
1999
Pages
2765 - 2768
Database
ISI
SICI code
0034-6748(199906)70:6<2765:ALDMSF>2.0.ZU;2-P
Abstract
A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip-sample distance control in the dynamic ope ration mode. Fast response was achieved by using a phase-locked loop for dr iving the mechanical oscillator. Possible applications of this setup for va rious scanning probe techniques are discussed. (C) 1999 American Institute of Physics. [S0034-6748(99)02206-6].