The effects of Miller coupling and thermal noise on a synchronizing flip-fl
op are described. Data on the metastability characteristics of the flip-flo
p are gathered and analyzed. True metastability is distinguished from the d
eterministic region. A worst case mean-time-between-failure bound is establ
ished. A simple and accurate test method is presented. A simple jamb latch
was used with driving circuits of two different strengths to determine the
role of input strength on T-w and tau. The flip-flop was fabricated on a 0.
25-mu m CMOS process.