Incremental testability analysis for partial scan selection and design transformations

This paper presents an efficient estimation method for incremental testabil ity analysis, which is based partially on explicit testability re-calculati on and partially on gradient techniques. The analysis results have been use d successfully to guide design transformations and partial scan selection. Experimental results on a variety of benchmarks show that the quality of ou r incremental testability analysis is similar to those of the conventional explicit testability re-calculation methods and the technique can be used e fficiently for improving the testability of a design during the high-level test synthesis and partial scan selection processes.