From design validation to hardware testing: A unified approach

Citation
G. Al-hayek et C. Robach, From design validation to hardware testing: A unified approach, J ELEC TEST, 14(1-2), 1999, pp. 133-140
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
14
Issue
1-2
Year of publication
1999
Pages
133 - 140
Database
ISI
SICI code
0923-8174(199902)14:1-2<133:FDVTHT>2.0.ZU;2-I
Abstract
In this paper we propose a new approach that addresses both the problems of design validation and hardware testing since the early stages of the desig n flow. The approach consists in adapting the mutation testing, a software method, to circuits described in VHDL. At the functional level, the approac h behaves as a design validation method and at the hardware level as a clas sical ATPG. Standard software test metrics are used for assessing the quali ty of the design validation process, and the hardware fault coverage for as sessing the test quality at the hardware level. An enhancement process that allows design validation to be efficiently reused for hardware testing is detailed. The approach is shown to be efficient upon a set of representativ e circuits.