Metrics and criteria for quality assessment of testable Hw Sw systems architectures

Citation
Op. Dias et al., Metrics and criteria for quality assessment of testable Hw Sw systems architectures, J ELEC TEST, 14(1-2), 1999, pp. 149-158
Citations number
33
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
14
Issue
1-2
Year of publication
1999
Pages
149 - 158
Database
ISI
SICI code
0923-8174(199902)14:1-2<149:MACFQA>2.0.ZU;2-9
Abstract
The purpose of this paper is to present a novel methodology for assessing t he quality of architecture solutions of hw/sw systems, with particular emph asis on testability. Criteria and metrics for quality assessment are propos ed and used to assist the design team in selecting a 'best-fitted' architec ture that satisfies not only functional requirements, but also test require ments. The methodology makes use of object-oriented modeling techniques. Ne ar-optimum clustering of methods and attributes into objects is carried out , in such a way that objects with moderate complexity, low coupling and hig h functional autonomy, result. The main features of the methodology are asc ertained through a case study.