Spin-dependent transport in ferromagnet-semiconductor structures is a field
of growing interest, driven by the possibility to realize solid-state MRAM
s compatible with existing memory technology. Ferromagnet-semiconductor con
tacts play a crucial role in all structures where spin injection into semic
onductors is involved. We have investigated the properties of Co contacts o
n InAs, the latter being known for its tendency to form Schottky barrier-fr
ee ohmic contacts to metals. Co layers of different thicknesses have been d
eposited by thermal evaporation. The macroscopic magnetization has been stu
died using SQUID magnetometry. Structural properties and intermixing have b
een investigated by nuclear magnetic resonance spectroscopy. Patterned Co c
ontacts have been characterized by I/V measurements at different temperatur
es. Our data indicate a partial intermixing over several monolayers at the
interface resulting in a thin layer with ferromagnetic properties. The I/V
characteristics show low contact resistance and a linear behaviour down to
60 K. (C) 1999 Elsevier Science B.V. All rights reserved.