We have measured the resistivity, temperature coefficient of resistivity (T
CR) and grain sizes in single films of Cu and Nb as a function of film thic
kness. We have compared our experimental results with the predictions of th
e theory due to Dimmich. This theory allows us to extract a value for grain
boundary reflectivity, R, which is subsequently used in the analysis of th
e resistivity and TCR of Cu/Nb multilayers. We present our values for grain
boundary reflectivity and the subsequent fit to the experimental resistivi
ty and TCR using Dimmich's equations. (C) 1999 Elsevier Science B.V. All ri
ghts reserved.