Light scattering characterization of metallic single films and multilayers

Brillouin light scattering has been exploited to investigate Ni thin films with thicknesses in the range 25-56 nm, and a Ni/Cu/Ni multilayer deposited by RF sputtering The Brillouin spectra exhibit both surface and bulk modes . The spin wave frequencies and light cross sections have been calculated t aking into account both dipolar and exchange interactions. as well as perpe ndicular surface anisotropy. The analysis of the dispersion curves allowed the determination of the magnetic parameters of the samples, (C) 1999 Elsev ier Science B.V. All rights reserved.