The kinetics of metal-induced-crystallisation of layered films containing a
morphous Ge (a-Ge) in contact with Bi nanocrystals (NCs) have been studied
by in situ transmission electron microscope annealing. The a-Ge crystallisa
tion temperature depends strongly on NC size and shape, the former influenc
ing the nucleation process through the metal surface area in contact with t
he semiconductor and the latter controlling the initial Ge crystal growth d
irection. (C) 1999 Elsevier Science B.V. All rights reserved.