X-ray standing waves (XSW) were used to investigate the structure of molecu
lar beam epitaxy (MBE) grown (AlAs)(3)(GaAs)(7) short-period superlattices
(SPSL). The modulation of the Al K, As L, and Ga L x-ray fluorescence induc
ed by XSW was measured at the zero-order superlattice (SL) satellite (AlAs)
(GaAs)(004,0) and the GaAs(004) substrate Bragg reflection. From the shape
of the fluorescence yield modulations and the diffraction pattern, a model
of the interfaces is derived by comparing the experimental data with dynami
cal calculations of the x-ray wave held distribution and reflectivity. A st
raightforward analysis of the fluorescence measurements at the SL satellite
shows that in AlAs layers a high crystalline order is established, whereas
in GaAs layers a fraction of the Ga and As atoms is not on ideal lattice s
ites, but is displaced towards the substrate. The data can be explained by
a model in which, at each AlAs/GaAs interface of the GaAs layers, two Ga at
om planes are displaced by 0.035 nm and 0.008 nm and one As atom plane by 0
.023 nm. The displacements within the GaAs layers exhibit a mirror symmetry
with respect to the centre of each layer.