Radiation damage measurements in room-temperature semiconductor radiation detectors

The literature of radiation damage measurements on cadmium zinc telluride ( CZT), cadmium telluride (CT), and mercuric iodide (HgI2) is reviewed and in the case of CZT supplemented by new alpha particle data. CZT strip detecto rs exposed to intermediate energy (1.3 MeV) proton fluences exhibit increas ed interstrip leakage after 10(10) p/cm(2) and significant bulk leakage aft er 10(12) p/cm(2). CZT exposed to 200 MeV protons shows a two-fold loss in energy resolution after a fluence of 5 x 10(9) p/cm(2) in thick (3 mm) plan ar devices but little effect in 2 mm devices. No energy resolution effects were noted from a moderated fission spectrum of neutrons after fluences up to 1010 n/cm(2), although activation was evident. Exposures of CZT to 5 MeV alpha particles at fluences up to 1.5 x 10(10) alpha/cm(2) produced a near linear decrease in peak position with fluence and increases in FWHM beginn ing at about 7.5 x 10(9) alpha/cm(2), CT detectors show resolution losses a fter fluences of 3 x 10(9) p/cm(2) at 33 MeV for chlorine-doped detectors. Indium-doped material may be more resistant. Neutron exposures (8 MeV) caus ed resolution losses after fluences of 2 x 10(10) n/cm(2). Mercuric iodide has been studied with intermediate energy protons (10-33 MeV) at fluences u p to 10(12) p/cm(2) and with 1.5 GeV protons at fluences up to 1.2 x 10(8) p/cm(2). Neutron exposures at 8 MeV have been reported at fluences up to 10 (15) n/cm(2). No radiation damage was reported under these irradiation cond itions. (C) 1999 Elsevier Science B.V. All rights reserved.