A new white light interferometric arrangement for contour mapping of light
diffusing but not depolarising surfaces is presented and compared with rela
ted electronic speckle and holographic interferometry (ESPI and HI) methods
. Using two angles of illumination of the tested surface, and modifying the
light beam in the observation pupil it is possible to observe contour frin
ges with arbitrary sensitivity depending on the geometry of a chosen set-up
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