The ac-susceptibility chi(ac) of ultrathin Co and Ni layers coupled indirec
tly across a Cu spacer layer is measured as a function of temperature in si
tu in UHV. Depending on the strength of the interlayer exchange interaction
one or two maxima of the susceptibility are recorded near the respective C
urie temperatures of the bare films. Using the element specificity of X-ray
magnetic circular dichroism (XMCD) two separate temperature-dependent magn
etization curves for Co and Ni are measured vanishing at different temperat
ures. The higher one of the two is the Curie temperature of the coupled sys
tems. Due to the interlayer interaction the lower characteristic temperatur
e cannot be interpreted as a thermodynamic phase transition.