Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

Authors
Karaiskaj, D Maxisch, T Ellmers, C Kolbe, HJ Weiser, G Rettig, R Leu, S Stolz, W Hofmann, M Jahnke, F Koch, SW Ruhle, WW
Citation
D. Karaiskaj et al., Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling, PHYS REV B, 59(21), 1999, pp. 13525-13527
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
59
Issue
21
Year of publication
1999
Pages
13525 - 13527
Database
ISI
SICI code
0163-1829(19990601)59:21<13525:LIASMW>2.0.ZU;2-Q
Abstract
The variation of the normal-mode coupling in a semiconductor microcavity is demonstrated by reducing the cavity quality through stepwise removing top mirror pairs. The dependence of the measured normal-mode coupling linewidth s on the cavity quality is well reproduced by calculations on the basis of a linear dispersion theory with broadened excitons in a microcavity.