Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering

Authors
Stangl, J Holy, V Mikulik, P Bauer, G Kegel, I Metzger, TH Schmidt, OG Lange, C Eberl, K
Citation
J. Stangl et al., Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering, APPL PHYS L, 74(25), 1999, pp. 3785-3787
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
25
Year of publication
1999
Pages
3785 - 3787
Database
ISI
SICI code
0003-6951(19990621)74:25<3785:SCGQDS>2.0.ZU;2-Q
Abstract
We present a structural investigation of buried C-induced Ge quantum dot mu ltilayers grown on (001) Si by molecular-beam epitaxy. Using grazing-incide nce small angle x-ray scattering, we determine the shape, the mean radius, height, and dot distance. The dot distribution is isotropic within the (001 ) interfaces, and no correlation of the dot positions along growth directio n was found. (C) 1999 American Institute of Physics. [S0003-6951(99)00825-6 ].