This work demonstrates integration of magnetic tunneling junctions with hyd
rogenated amorphous silicon (a-Si:H) diodes. In the finished device 11.4% c
urrent change is measured when the junction free layer is switched in an ex
ternal magnetic field, for 0.86 V applied to the junction-diode series. In
the integrated device, the measured individual tunneling magnetoresistance
signal is 25.3% at 7 mV bias, demonstrating junction robustness and process
compatibility. The junction-diode series is necessary for bit selectivity
in magnetic random access memories. Vertical growth of these devices may al
low higher density architectures. (C) 1999 American Institute of Physics. [
S0003-6951(99)03625-6].