The performance of continuous-time (CT) delta-sigma modulators (Delta Sigma
M's) suffers more severely from time jitter in the quantizer clock than di
screte-time designs. Clock jitter adds a random phase modulation to the mod
ulator feedback signal, which whitens the quantization noise in the band of
interest and hence degrades converter resolution. Even with a perfectly un
iform sampling clock, a similar whitening can be caused by metastability in
the quantizer: a real quantizer has finite regeneration gain, and thus, qu
antizer inputs near zero take longer to resolve. This paper quantifies the
performance lost due to clock jitter in a practical integrated CT Delta Sig
ma M clocked with an on-chip voltage-controlled oscillator. It also charact
erizes metastability in a practical integrated quantizer using the quantize
r output zero-crossing time and rise time as a function of both quantizer i
nput voltage and the slope of the input voltage at the sampling instant, an
d predicts the maximum-achievable performance of a practical CT Delta Sigma
M given jitter and metastability constraints.