We have measured the thermoelectric transfer difference of two thermal volt
age converters using a Josephson source and compared the results to similar
measurements made with a conventional semiconductor source, Both sources u
se the fast reversed de method. The Josephson source is an array of 16384 s
uperconductor-normal-superconductor Josephson junctions that is rapidly swi
tched between voltage states of +0.5, 0, and -0.5 V, A marginally significa
nt difference is detected between measurements with the two different sourc
es.