Electrooptic sensor for near-field measurement

Citation
F. Cecelja et W. Balachandran, Electrooptic sensor for near-field measurement, IEEE INSTR, 48(2), 1999, pp. 650-653
Citations number
9
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
48
Issue
2
Year of publication
1999
Pages
650 - 653
Database
ISI
SICI code
0018-9456(199904)48:2<650:ESFNM>2.0.ZU;2-Q
Abstract
This paper presents a novel electric field measurement system utilizing opt ical technology, which has been developed, tested, and calibrated for the n ear-field measurement in the frequency range up to 1.8 GHz. The measuring p robe is passive, all-dielectric, electromagnetic interference (EMI)-immune, and provides the information on the field strength, frequency, and phase. The achieved measurement resolution and minimum measurable fields were 10 V /m, with a spatial resolution of 10 mm, A finite-difference time-domain (FD TD) algorithm for solving Maxwell's equation was used to assess the field p erturbation by the presence of the measuring probe and the suitability for the near-field measurement.