Photoluminescence excitation spectroscopy was carried out on the I-4(13/2)-
->I-4(15/2) transition from Er-doped amorphous silicon-nitrogen thin film a
lloys (a-SiN). The sample was prepared by cosputtering of a Si target parti
ally covered with Er pellets. It is demonstrated that Er3+ ions may be exci
ted by direct sharp-line intra-4f-shell absorption as well as by energy tra
nsfer from the a-SiN matrix. The effects of temperature and possible energy
transfer mechanisms to Er ions are presented and discussed. (C) 1999 Ameri
can Institute of Physics. [S0021-8979(99)01713-2].