Field mapping with the magnetic resonance force microscope

Citation
Tg. Ruskell et al., Field mapping with the magnetic resonance force microscope, J APPL PHYS, 86(1), 1999, pp. 664-670
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
1
Year of publication
1999
Pages
664 - 670
Database
ISI
SICI code
0021-8979(19990701)86:1<664:FMWTMR>2.0.ZU;2-S
Abstract
We have developed magnetic resonance force microscopy for quantitative meas urements of magnetic fields. A microscopic particle attached near the end o f a microcantilever serves as the field sensing probe. We have demonstrated two-dimensional field mapping with a lateral resolution of 3.2 mu m and a field resolution of 0.19 mT (1.9 G). The instrument holds considerable prom ise for field mapping with spatial resolution better than 0.1 mu m at room temperature. Applications include field mapping of magnetic recording heads . (C) 1999 American Institute of Physics. [S0021-8979(99)00513-7].